Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions

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TextPublication details: New York, N.Y. : Kaplan, 2008Edition: 2nd edDescription: 227 p. : illISBN:

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Item type	Home library	Collection	Shelving location	Call number	Status	Barcode
Books	BU Library and Learning Space	Books	Book Shelves	PE1128 V365I 2008 (Browse shelf(Opens below))	Available	201008300007

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Cover title: Inside the TOEIC exam : your step-by-step guide to scoring higher

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