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LSI/VLSI testability design

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Material type: Text

TextPublication details: New York, N.Y. : McGraw-Hill, 1988Description: 702Subject(s):

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Holdings
Item type	Home library	Collection	Shelving location	Call number	Status	Barcode
Books	BU Library and Learning Space	Books	Book Shelves	TK7874 T784L (Browse shelf(Opens below))	Available	112628

Total holds: 0

Previous			No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	Next
Previous	TK7874 S536I Integrated circuit design, fabrication and test	TK7874 S536I Integrated circuit design, fabrication and test	TK7874 S63I Introduction to VLSI process engineering	TK7874 T784L LSI/VLSI testability design	TK7874 T784L LSI/VLSI testability design	TK7874 U935F Fundamentals of MOS digital integrated circuits	TK7874 U935F Fundamentals of MOS digital integrated circuits	Next

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