Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].

Contributor(s):

Material type: Text

TextSeries: Publication details: Hoboken, N.J. : IEEE Press, c2009.Description: 624 p. : illISBN:

Subject(s):

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Home library	Collection	Shelving location	Call number	Status	Barcode
Books	BU Library and Learning Space	Books	Book Shelves	TK7871.99.M44 R444 (Browse shelf(Opens below))	Available	201106140023

Total holds: 0

Includes bibliographical references and index

There are no comments on this title.

to post a comment.

Storage	Name	Value	Expiration	Description
Cookie	CGISESSID	Session ID	Until logout or end of session	Session cookie
Cookie	KohaOpacLanguage	Language code	3 years	Stores the language the user selected, so the online catalog will appear in that same language the next time it is visited.
Cookie	form_serialized form_serialized_limits	Search terms and limits	End of session or when the advanced search page is accessed again.	jQuery cookie. Stores search terms and limits of the last advanced search. Set when an advanced search is submitted.
Cookie	search_path_code	ads (fewer) or exs (more)	End of session or when the advanced search page is accessed again.	jQuery cookie. Related to serialized_form* cookies. Stores if the advanced search form was used with 'More options' or 'Fewer options'.
Cookie	num_paragraph	Count of search options added	End of session or when the advanced search page is accessed again.	jQuery cookie. Used to store the number of created options when user selects 'More options' in advanced search to increase search boxes.
Cookie	bib_list	List of record IDs (biblionumbers) separated by /	End of session or until the cart is emptied.	Stores cart contents in the online catalog. Set when records are added to the cart for the first time.